Increased Conductance of Individual Self-Assembled GeSi Quantum Dots by Inter-Dot Coupling Studied by Conductive Atomic Force Microscopy

Yifei Zhang,Fengfeng Ye,Jianhui Lin,Zuimin Jiang,Xinju Yang
DOI: https://doi.org/10.1186/1556-276x-7-278
2012-01-01
Nanoscale Research Letters
Abstract:The conductive properties of individual self-assembled GeSi quantum dots (QDs) are investigated by conductive atomic force microscopy on single-layer (SL) and bi-layer (BL) GeSi QDs with different dot densities at room temperature. By comparing their average currents, it is found that the BL and high-density QDs are more conductive than the SL and low-density QDs with similar sizes, respectively, indicating the existence of both vertical and lateral couplings between GeSi QDs at room temperature. On the other hand, the average current of the BL QDs increases much faster with the bias voltage than that of the SL QDs does. Our results suggest that the QDs’ conductive properties can be greatly regulated by the coupling effects and bias voltages, which are valuable for potential applications.
What problem does this paper attempt to address?