Abstract:Electrostatic discharge (ESD) has been one of the major causes for the failure of electronic equipment and components and have attracted quite significant research efforts in minimizing the losses induced. Much tougher challenge comes up in the nano CMOS era. For the device technology itself, the aggressive scaling on gate length, high-k replacement of gate oxide, and the reduction of supply voltage have made the design window of ESD protection device be ever narrower. New ESD protection devices are yet to be developed for the 10 nm technology and beyond. For system and application level, the mobile devices we used right now are much vulnerable as they are more frequent to be exposed to various sources of ESD and power surges. Fatal ESD strike protection is always the primary design specification and should have been mostly fulfilled. The effects of non-fatal ESD strike has not attracted much attention yet. Recent experiment showed that the non-fatal ESD strikes at gate and drain can cause significant charge trapping and trap generation. It resulted in the device characteristic degradation and hence some reliability issues of CMOS circuits and the MOS-based ESD clamps. This review addresses all these issues in detail.

An Overview of ESD Protection in Nanometer IC

Analysis of 65 Nm Technology Grounded-Gate NMOS for On-Chip ESD Protection Applications

On the ESD Protection and Non-Fatal ESD Strike on Nano CMOS Devices

Ggnmos As Esd Protection in Different Nanometer Cmos Process

Implementation Of Temperature Dependent Contact Resistance Model For The Analysis Of Deep Submicron Devices Under Esd

Evaluation of RF electrostatic discharge (ESD) protection in 0.18-μm CMOS technology

Nano enabled 3D integration of on-chip ESD protection for ICs

FOD Based ESD Protection Devices in Deep Sub-micron Technology

Effects of Finger Width and Metal Routing of GGNMOS on ESD Protection

ESD Protection of NMOS Device at Different Gate Bias

On-chip ESD Protection Design for Integrated Circuits: an Overview for IC Designers

Effects of process variation on turn-on voltages of a multi-finger gate-coupled NMOS ESD protection device

A Systematic Study of ESD Protection Co-Design with High-Speed and High-Frequency ICs in 28 Nm CMOS.

ESD Circuits Design for High-Speed Analog CMOS Integrated Circuits

ESD Protection Issues in IC Design

Investigation on Bi-directional SCR ESD Protection Devices in a 0.18 μm RF CMOS Process

On-Chip ESD Protection Design for Ics

A Novel Substrate-Optimized GGNMOS for Low-Voltage ESD Protection in 65 nm CMOS Process

Design and analysis of new silicided nano crystal dots field programmable ESD protection structures in BiCMOS

Effects of Non-Fatal Electrostatic Discharge on the Threshold Voltage Degradation in Nano CMOS Devices

Temperature Dependence of Diode and Ggnmos ESD Protection Structures in 28nm CMOS