Abstract:Electrostatic discharge (ESD) has been one of the major causes for the failure of electronic equipment and components and have attracted quite significant research efforts in minimizing the losses induced. Much tougher challenge comes up in the nano CMOS era. For the device technology itself, the aggressive scaling on gate length, high-k replacement of gate oxide, and the reduction of supply voltage have made the design window of ESD protection device be ever narrower. New ESD protection devices are yet to be developed for the 10 nm technology and beyond. For system and application level, the mobile devices we used right now are much vulnerable as they are more frequent to be exposed to various sources of ESD and power surges. Fatal ESD strike protection is always the primary design specification and should have been mostly fulfilled. The effects of non-fatal ESD strike has not attracted much attention yet. Recent experiment showed that the non-fatal ESD strikes at gate and drain can cause significant charge trapping and trap generation. It resulted in the device characteristic degradation and hence some reliability issues of CMOS circuits and the MOS-based ESD clamps. This review addresses all these issues in detail.

On-chip ESD Protection Design for Integrated Circuits: an Overview for IC Designers

On-Chip ESD Protection Design for Ics

An Overview of ESD Protection in Nanometer IC

On the ESD Protection and Non-Fatal ESD Strike on Nano CMOS Devices

Key Aspects on ESD Protection Design for ICs: Mixed-Mode Simulation and RF/mixed-signal ESD

Electrostatic Discharge Protection for RF Integrated Circuits: New ESD Design Challenges

ESD Circuits Design for High-Speed Analog CMOS Integrated Circuits

A Novel On-Chip Electrostatic Discharge Protection Design for Rf Ics

Circuit-level ESD Protection Simulation Using Behavior Models in 28nm CMOS

A design technique overview on broadband RF ESD protection circuit designs

A 3d Mixed-Mode Esd Protection Circuit Simulation-Design Methodology

Implementation Of Temperature Dependent Contact Resistance Model For The Analysis Of Deep Submicron Devices Under Esd

Analysis of 65 Nm Technology Grounded-Gate NMOS for On-Chip ESD Protection Applications

A Systematic Study of ESD Protection Co-Design with High-Speed and High-Frequency ICs in 28 Nm CMOS.

Nano enabled 3D integration of on-chip ESD protection for ICs

On Chip Electrostatic Discharge Protection for MEMS Gas Sensor System

FOD Based ESD Protection Devices in Deep Sub-micron Technology

On-chip EMC issue: the implementation of patterned ground shields for silicon devices

A Novel and Powerful TCAD Methodology to Evaluate Performance of ESD Protection Devices

Mixed-mode simulation-design for IEC-ESD protection

Power System ESD Protection Circuit Design in CMOS IC