Mixed-mode simulation-design for IEC-ESD protection

fei yao,xin wang,shijun wang,bo qin,albert wang,hongyi chen,siqiang fan,bin zhao
DOI: https://doi.org/10.1109/ICSICT.2010.5667438
2010-01-01
Abstract:Electrostatic discharge (ESD) protection becomes essential to advanced integrated circuits (IC). Very fast IEC-ESD failure and protection design are emerging challenges for contemporary ICs, particularly for consumer and portable electronics. This paper presents a new mixed-mode IEC-ESD simulation-design method, which involves process, device, circuit and system level simulation to accurately address the ultra-fast IEC ESD phenomena. The new IEC-ESD design technique allows ESD design optimization and prediction. Experimental results are depicted to validate the new design technique.
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