Abstract:Electrostatic discharge (ESD) has been one of the major causes for the failure of electronic equipment and components and have attracted quite significant research efforts in minimizing the losses induced. Much tougher challenge comes up in the nano CMOS era. For the device technology itself, the aggressive scaling on gate length, high-k replacement of gate oxide, and the reduction of supply voltage have made the design window of ESD protection device be ever narrower. New ESD protection devices are yet to be developed for the 10 nm technology and beyond. For system and application level, the mobile devices we used right now are much vulnerable as they are more frequent to be exposed to various sources of ESD and power surges. Fatal ESD strike protection is always the primary design specification and should have been mostly fulfilled. The effects of non-fatal ESD strike has not attracted much attention yet. Recent experiment showed that the non-fatal ESD strikes at gate and drain can cause significant charge trapping and trap generation. It resulted in the device characteristic degradation and hence some reliability issues of CMOS circuits and the MOS-based ESD clamps. This review addresses all these issues in detail.

Design and analysis of new silicided nano crystal dots field programmable ESD protection structures in BiCMOS

Programmable On-Chip Esd Protection Using Nanocrystal Dots Mechanism And Structures

Nano enabled 3D integration of on-chip ESD protection for ICs

Analysis of 65 Nm Technology Grounded-Gate NMOS for On-Chip ESD Protection Applications

An Overview of ESD Protection in Nanometer IC

Evaluation of RF electrostatic discharge (ESD) protection in 0.18-μm CMOS technology

Investigation on Bi-directional SCR ESD Protection Devices in a 0.18 μm RF CMOS Process

Very Small Snapback Silicon-Controlled Rectifier for Electrostatic Discharge Protection in 28 Nm Processing.

A Systematic Study of ESD Protection Co-Design with High-Speed and High-Frequency ICs in 28 Nm CMOS.

FOD Based ESD Protection Devices in Deep Sub-micron Technology

Design Analysis of a Novel Low Triggering Voltage Dual Direction SCR ESD Device in 0. 18μm Mixed Mode RFCMOS Technology

Novel Nanophase-Switching ESD Protection

On the ESD Protection and Non-Fatal ESD Strike on Nano CMOS Devices

A Novel On-Chip Electrostatic Discharge Protection Design for Rf Ics

On Chip Electrostatic Discharge Protection for MEMS Gas Sensor System

Investigation of Boundary-Mos-triggered SCR Structures for On-Chip ESD Protection

A Pad-Oriented Novel Electrostatic Discharge Protection Structure For Mixed-Signal ICs

Improvement on Diode String Structure for 65-Nm RF ESD Protection

Design and Analysis of an Area-Efficient High Holding Voltage ESD Protection Device

Characterizing Phase Switching Structures for ESD Protection

New Electrostatic Discharge Protection Device for VBO High Speed Chip