Study of the Surface-Layer of Lead Titanate Thin-Film by X-Ray-Diffraction

WG LIU,LB KONG,LY ZHANG,X YAO
DOI: https://doi.org/10.1016/0038-1098(94)00856-6
IF: 1.934
1995-01-01
Solid State Communications
Abstract:Lead titanate ferroelectric thin films are prepared by a modified sol-gel process and the differences between the surface and bulk structure are studied. It is experimentally investigated with glancing angle x-ray diffraction (GAXRD) that the lattice constants of the surface layer of lead titanate thin film are differing from those of the inner part, crystallite size and lattice strain increase towards the substrate.
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