Abstract:A single crystal of lead-zirconate-titanate (PZT), composition Pb(Zr0.80Ti0.20)O3, was studied by polarized-Raman scattering as a function of temperature. Raman spectra reveal that the local structure deviates from the average structure in both ferroelectric and paraelectric phases. We show that the crystal possesses several, inequivalent complex domain boundaries which show no sign of instability even 200 K above the ferroelectric-to-paraelectric phase transition temperature TC. Two types of boundaries are addressed. The first boundary was formed between ferroelectric domains below TC. This boundary remained stable up to the highest measurement temperatures, and stabilized the domains so that they had the same orientation after repeated heating and cooling cycles. These domains transformed normally to the cubic paraelectric phase. Another type of boundary was formed at 673 K and exhibited no signs of instability up to 923 K. The boundary formation was reversible: it formed and vanished between 573 and 673 K during heating and cooling, respectively. A model in which the crystal is divided into thin slices with different Zr/Ti ratios is proposed. The physical mechanism behind the thermal-stress-induced structural changes is related to the different thermal expansion of the slices, which forces the domain to grow similarly after each heating and cooling cycle. The results are interesting for non-volatile memory development, as it implies that the original ferroelectric state can be restored after the material has been transformed to the paraelectric phase. It also suggests that a low-symmetry structure, stable up to high-temperatures, can be prepared through controlled deposition of layers with desired compositions.

PHASE TRANSITION IN POLYCRYSTALLINE FERROELECTRIC THIN FILMS——STRESS AND SIZE EFFECTS

Size Effect on Phase Transition Temperature of Epitaxial Ferroelectric Films

Phase Transformation Properties of Finite Size Ferroelectric Thin Film with Structural Transition Zones

Phase Transition Related Stress in Ferroelectric Thin Films

Influence of Surface Transition Layers on Phase Transformation and Pyroelectric Properties of Ferroelectric Thin Film

Thinckness dependence of phase transition temperature of epitaxial ferroelectric films

Effect of Crystal Orientation on the Phase Diagrams, Dielectric and Piezoelectric Properties of Epitaxial BaTiO3 Thin Films

Properties of Phase Transformation of Ferroelectric Thin Films with Surface Layers

Effects Of Unequally Biaxial Misfit Strains On Polarization Phase Diagrams In Embedded Ferroelectric Thin Layers: Phase Field Simulations

Effects of Thickness on the Polarization States in Epitaxial Ferroelectric Thin Films

Influence of Phase Transition Induced by Residual Stress on Ferroelectric Properties of Highly (100)-Oriented Pb(Zr0.52Ti0.48)O3 Thin Films

PHASE STABILITY OF SINGLE DOMAIN EPITAXIAL FERROELECTRIC FILMS

Phase Field Analysis of Crack Tip Parameters in Ferroelectric Polycrystals under Large-Scale Switching

Simulation of Characteristics of Phase Transitions in Ferroelectric Thin Films

Phase transitions and thermal-stress-induced structural changes in a ferroelectric Pb(Zr0.80Ti0.20)O3 single crystal

Domain Structures and Ferroelectric Property Under Open and Short Circuit Electrical Boundary in Epitaxial Ferroelectric Thin Films

Impact Of Lattice Strain On The Phase Formation, Polarization, And Dielectric Constant Of Pbzr1-Xtixo3 Films

Ferroelectric Phase Transitions and Electromechanical Properties of Barium Titanate and Lead Titanate Crystals under Uniaxial and Shear Stresses: A Thermodynamic Analysis

Strain-Driven Phase Boundaries in Bifeo3 Thin Films Studied by Atomic Force Microscopy and X-Ray Diffraction

CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES: Study of Phase Transition Properties in Epitaxial Ferroelectric Film

Stress-induced shifting of the morphotropic phase boundary in sol–gel derived Pb(Zr0.5Ti0.5)O3 thin films