Study of phase transition properties in epitaxial ferroelectric film
WANG Chun-Dong,TENG Bao-Hua,JU Yong-Feng,CHENG Deng-Mu,ZHANG Chun-Lai,王春栋,滕保华,居勇峰,程登木,章春来
DOI: https://doi.org/10.1088/0253-6102/54/4/32
2010-01-01
Communications in Theoretical Physics
Abstract:Based on the transverse Ising model and using decoupling approximation to the Fermi-type Green's function, we study the phase transition properties of the epitaxial ferroelectric film with one substrate. A general recursive equation of the ferroelectric thin film with two n-layer materials is obtained, which enables us to study the phase transition properties for any number layers for epitaxial ferroelectric thin film. With the help of this equation, we analyze the effect of the exchange interaction and the transverse field in the phase diagram, the influence to the polarizations and Curie temperature numerically. The results show that epitaxial ferroelectric film are able to induce a strong increase or decrease of Curie temperature to different exchange interactions and transverse fields within the epitaxial film layers. The theoretical results are in reasonable accordance with experimental data of different ferroelectric thin film.