STRUCTURE AND DIELECTRIC PROPERTIES OFLa-DOPED LEAD STRONTIUM TITANATE THIN FILMS DERIVED FROM SOL–GEL METHOD

X. T. Li,C. Wu,W. J. Weng,G. R. Han,P. Y. Du
DOI: https://doi.org/10.1142/s0218625x08010877
2008-01-01
Surface Review and Letters
Abstract:A series of ( Pb0.4Sr0.6)1-xLa2x/3TiO3(PSLT) thin films were deposited on ITO/glass substrates by sol–gel technique. Their phase status, surface morphology, and dielectric properties were studied by X-ray diffraction, scanning electron microscope, and impedance analyzer, respectively. Results show that the PSLT thin films were consisted of tetragonal perovskite phase PSLT thin films for x < 0.4, and cubic perovskite phase PSLT thin films for x > 0.4. Dielectric properties such as dielectric constants, dielectric tunabilitis, and inharmonic coefficient were characterized as a function of the film composition.
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