Growing Extremely Thin Bulklike Metal Film on a Semiconductor Surface: Monolayer Al(111) on Si(111)

Ying Jiang,Yong-Hyun Kim,S. B. Zhang,Philipp Ebert,Shenyuan Yang,Zhe Tang,Kehui Wu,E. G. Wang
DOI: https://doi.org/10.1063/1.2804010
IF: 4
2007-01-01
Applied Physics Letters
Abstract:We report combined scanning tunneling microscopy, x-ray photoelectron emission spectroscopy, electron energy loss spectroscopy, and theoretical study of the growth of ultrathin Al film on the Si(111) substrate. We show that by (i) a modification of the substrate reconstruction with a 3×3 surface and (ii) a choice of materials with commensurate lattices, atomically flat film can be obtained even at the ultimate one monolayer limit, while maintaining a bulklike atomic structure. Detailed analysis shows that this monolayer Al(111)-1×1 film is electronically decoupled from the Si substrate, and it shows metallic characteristics.
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