"Electronic Growth" of Metallic Overlayers on Semiconductor Substrates

Zy Zhang,Q Niu,Ck Shih
DOI: https://doi.org/10.1103/physrevlett.80.5381
IF: 8.6
1998-01-01
Physical Review Letters
Abstract:We present a novel "electronic growth" model for metallic thin films on semiconductor substrates. Depending on the competition between the effects of quantum confinement, charge spilling, and interface-induced Friedel oscillations, different types of film stability are defined, as characterized by the existence of critical/magic thicknesses for smooth growth. In particular, smooth growth can be achieved only above a few monolayers for noble metals, and only for the first layer for alkali metals.
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