Abstract:A proposed mechanism called "pseudo‐wet plasma etching" explains cryogenic etching process with hydrogen‐containing fluorocarbon plasmas. At cryogenic temperatures, the synergy demonstrates that the enhanced etch process is determined by the surface interactions between ions, surface‐adsorbed HF/H2O, and the material being etched, unlike conventional reactive ion etching conducted at high temperatures. Manufacturing semiconductor devices requires advanced patterning technologies, including reactive ion etching (RIE) based on the synergistic interactions between ions and etch gas. However, these interactions weaken as devices continuously scale down to sub‐nanoscale, primarily attributed to the diminished transport of radicals and ions into the small features. This leads to a significant decrease in etch rate (ER). Here, a novel synergistic interaction involving ions, surface‐adsorbed chemistries, and materials at cryogenic temperatures is found to exhibit a significant increase in the ER of SiO2 using CF4/H2 plasmas. The ER increases twofold when plasma with H2/(CF4 + H2) = 33% is used and the substrate temperature is lowered from 20 to −60 °C. The adsorption of HF and H2O on the SiO2 surface at cryogenic temperatures is confirmed using in situ Fourier transform infrared spectroscopy. The synergistic interactions of the surface‐adsorbed HF/H2O as etching catalysts and plasma species result in the ER enhancement. Therefore, a mechanism called "pseudo‐wet plasma etching" is proposed to explain the cryogenic etching process. This synergy demonstrates that the enhanced etch process is determined by the surface interactions between ions, surface‐adsorbed chemistry, and the material being etched, rather than interactions between ion and gas phase, as observed in the conventional RIE.

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Synchrotron-Radiation-Induced Deposition of Etch-Protecting Film on Si in Cf4 Plasma

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An Etchant for Delineation of Flow Pattern Defects in Heavily Doped N-Type Silicon Wafers

Sub-damage-threshold plasma etching and profile tailoring of Si through laser-stimulated thermal desorption

A study on the etching characteristics of atmospheric pressure plasma for single-crystal silicon wafer

Low-damage etching of poly-Si and SiO 2 via a low-energy electron beam in inductively coupled CF 4 plasma

Simulation of SiO2 etching in an inductively coupled CF4 plasma

Simulation of SiO<sub>2</sub> etching in an inductively coupled CF<sub>4</sub> plasma

Wafer level microarcing model in 90nm chemical-vapor deposition low-k via etch on 300mm silicon-on-insulator substrate

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Dry Etching of Silicon Materials in SF 6 Based Plasmas: Roles of and Gas Additives

Pseudo‐Wet Plasma Mechanism Enabling High‐Throughput Dry Etching of SiO2 by Cryogenic‐Assisted Surface Reactions

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Low-temperature plasma etching of high aspect-ratio densely packed 15 to sub-10 nm silicon features derived from PS-PDMS block copolymer patterns

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