Local Strain Relaxation in Czochralski-grown GeSi Bulk Alloys

I Yonenaga,M Sakurai,M Nonaka,T Ayuzawa,MHF Sluiter,Y Kawazoe
DOI: https://doi.org/10.1016/j.physb.2003.09.228
2003-01-01
Abstract:The local atomic structure in GeSi alloys was studied experimentally and theoretically. By extended X-ray absorption fine structure measurements in Czochralski-grown Ge1-xSix bulk alloys, it is found that the Ge-Ge, Ge-Si (Si-Ge) and Si-Si bond lengths maintain distinctly different lengths and vary in a linear fashion as a function of alloy composition across the entire composition range 0<x<1, in good agreement with what is expected from the ab inito electronic structure calculations. It is known that both bond lengths and bond angles are distorted with alloy composition in GeSi. (C) 2003 Elsevier B.V. All rights reserved.
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