Electroreflectance Study Of Strained-Layer Gexsi1-X/Si Multiple-Quantum Wells

Shihong Pan,Shuo Huang,Wei Chen,Cunzhou Zhang,Chi Sheng,Xun Wang
DOI: https://doi.org/10.1088/0256-307X/11/2/016
1994-01-01
Chinese Physics Letters
Abstract:A set of strained-layer GexSi1-x/Si multiple quantum wells has been investigated by electroreflectance (ER) spectroscopy. In the ER spectra we have observed transitions in the quantum wells associated with the critical points E0, E1, as well as E0'. The transitions of E0 and E0', which are very weak in the bulk material, are apperently enhanced in quantum wells.
What problem does this paper attempt to address?