Photoluminescence spectra from SiGe/Si strained layer quantum well structure

Daming Huang,Min Yang,Chi Sheng,Xuekun Lu,Dawi Gong,Xiangjiu Zhang,Xun Wang
1994-01-01
Abstract:The excitonic transitions were observed in photoluminescence spectrum from SiGe/Si strained layer quantum well structure grown by solid source molecular beam epitaxy. From the peak energy of no-phonon or TO-phonon exciton line, the Ge composition in quantum well layers was determined. The result was compared with that obtained from the X-ray diffraction spectrum, and it was found that it is easier and more accurate to determine the alloy composition from the excitonic photoluminescence spectra than from X-ray diffraction measurements for the structures with small Ge composition.
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