Phonon-Spectra Of Strained Si And Ge

Jian Zi,Kaiming Zhang,Xide Xie
DOI: https://doi.org/10.1103/PhysRevB.45.9447
IF: 3.7
1992-01-01
Physical Review B
Abstract:Phonon spectra of Si and Ge grown pseudomorphically on [001]-oriented Si1-xGex substrates are studied theoretically. In the case of Si or Ge grown on a [001]-oriented substrate, the frequency shift induced by the biaxial strain for the LO-phonon mode is found to be nearly rigid along the [001] direction, whereas for the TO-phonon mode the frequency shift is wave-vector dependent. Frequency shifts of the LA- and TA-phonon modes also show a wave-vector dependence. Raman spectra of strained Si/Ge superlattices are calculated with strained force constants and a good agreement with experimental Raman spectra is obtained.
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