Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays

Ryutaro Nishimura,Shunji Kishimoto,Toshihiko Sasaki,Shingo Mitsui,Masayoshi Shinya,Yasuo Arai,Toshinobu Miyoshi
DOI: https://doi.org/10.1016/j.nima.2020.164380
2024-05-14
Abstract:Residual stress is an important factor governing evaluating and controlling the quality of metal materials in industrial products. X-ray measurements provide one of the most effective means of evaluating residual stress without destruction. In such measurements, the effects of residual stress on the crystal structure can be observed through the Debye ring deformation.
Instrumentation and Detectors
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