Method to Analyze and Evaluate the Depth Profile of the Three Dimensional Residual Stresses State with X-ray

Chen Yu
2002-01-01
Abstract:A new method to determine, non-destructively, the full three-dimensional residual stress state with depth resolution has been developed to direct at the insufficiency of X-ray method at the measurement of light element materials such as beryllium. The analysis incorporates a model function based on the linear theory of elasticity, under consideration of its conditions of equilibrium as well as the surface boundary condition. The principle of analysis and evaluation for this method and the required device, measurement are introduced. With this method a computer program, which can do full three dimensional stresses analysis at arbitrary point in the surface of and whin a light element material to deal with the experiment is designed. Finally, the program is verified with the experimental data of beryllium. The results show that the parallel components σ 11 , σ 22 vary a lot with the depth while shear components σ 12 ?σ 13 and σ 23 and the parallel components σ 33 are all small.
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