Comparison of Residual Stress Analysis Methods: X-Ray Diffraction Method vs Stress Release Method

Peng JIN,Xi-de LI
DOI: https://doi.org/10.7520/1001-4888-17-308
2017-01-01
Abstract:Residual stress analysis methods can be coarsely cataloged into the following types:diffraction method,stress release method,and sound,light,magnetic method,etc.Among them,X-ray diffraction and hole-drilling technique are two of the most mature and most widely used methods.When the stress is uniform and the value is small,these two methods can give similar results.However,when the sample is small and its microstructure is complex,there will be a significant difference between the results given by both of the mentioned methods.In this paper,residual stress on the surface of the same pure copper sample is analyzed by X-ray diffraction and ring-core method,the analysis results are compared and the related factors are discussed.The applicability of X-ray diffraction method and ring core method is discussed:the former is suitable for crystal material and in non-destructive examination,and the latter is more suitable to reflect current stress level.In addition,the purpose of stress testing should be taken into account in method selection.
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