X-ray stress measurement with two-dimensional detector based on Fourier analysis

Toshiyuki Miyazaki,Toshihiko Sasaki

DOI: https://doi.org/10.3139/146.111101

2014-09-15

International Journal of Materials Research

Abstract:Abstract A two-dimensional X-ray diffraction technique for stress measurement is reported. The proposed technique determines the stress from the Fourier series of a Debye–Scherrer ring. This technique does not require sample inclination to several different angles to determine the stress as the conventional sin 2 ψ technique does. Although the cos α technique has the same advantage, the proposed technique can also determine stress from an imperfect Debye–Scherrer ring. To measure the effectiveness of the proposed technique, a four-point bending test was performed on a steel specimen to determine the Fourier series of Debye–Scherrer rings. The stresses determined from the Fourier series were consistent with those determined using the cos α technique. The proposed technique is expected to extend the application range of current X-ray stress measurement.

metallurgy & metallurgical engineering