Selective Epitaxial Growth of GaAs on Ge Substrates with a SiO2 Pattern

G. Brammertz,M. Caymax,Y. Mols,S. Degroote,M. Leys,J. Van Steenbergen,G. Winderickx,G. Borghs,M. Meuris
DOI: https://doi.org/10.48550/arXiv.cond-mat/0703664
2007-03-26
Materials Science
Abstract:We have selectively grown thin epitaxial GaAs films on Ge substrates with the aid of a 200 nm thin SiO2 mask layer. The selectively grown structures have lateral sizes ranging from 1 um width up to large areas of 1 by 1 mm2. The growth is fully selective, thanks to an optimized growth procedure, consisting of a 13 nm thin nucleation layer grown at high pressure, followed by low pressure growth of GaAs. This growth procedure inhibits the nucleation of GaAs on the mask area and is a good compromise between reduction of loading effects and inhibition of anti phase domain growth in the GaAs. Nevertheless, both microscopic and macroscopic loading effects can still be observed on x-section SEM images and profilometer measurements. X-ray diffraction and low temperature photoluminescence measurements demonstrate the good microscopic characteristics of the selectively grown GaAs.
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