Molecular Beam Epitaxy Growth of Gaas on an Offcut Ge Substrate

He Ji-Fang,Niu Zhi-Chuan,Chang Xiu-Ying,Ni Hai-Qiao,Zhu Yan,Li Mi-Feng,Shang Xiang-Jun
DOI: https://doi.org/10.1088/1674-1056/20/1/018102
2011-01-01
Abstract:Molecular beam epitaxy growth of GaAs on an offcut Ge(100) substrate has been systemically investigated. A high quality GaAs/Ge interface and GaAs film on Ge have been achieved. High temperature annealing before GaAs deposition is found to be indispensable to avoid anti-phase domains. The quality of the GaAs film is found to strongly depend on the GaAs/Ge interface and the beginning of GaAs deposition. The reason why both high temperature annealing and GaAs growth temperature can affect epitaxial GaAs film quality is discussed. High quality In0.17Ga0.83As/GaAs strained quantum wells have also been achieved on a Ge substrate. Samples show at surface morphology and narrow photoluminescence line width compared with the same structure sample grown on a GaAs substrate. These results indicate a large application potential for III-V compound semiconductor optoelectronic devices on Ge substrates.
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