Anisotropic Charge Transport Enabling High‐Throughput and High‐Aspect‐Ratio Wet Etching of Silicon Carbide (Small Methods 8/2022)

Dachuang Shi,Yun Chen,Zijian Li,Shankun Dong,Liyi Li,Maoxiang Hou,Huilong Liu,Shenghe Zhao,Xin Chen,Ching‐Ping Wong,Ni Zhao
DOI: https://doi.org/10.1002/smtd.202270049
IF: 12.4
2022-08-29
Small Methods
Abstract:Inside Back Cover In article number 2200329, Chen, Zhao, and co‐workers demonstrated an etching structure that exploits anisotropic charge carrier flow to enable high‐throughput, external‐bias‐free wet etching of SiC micro‐/nanostructures with record high etching speed and aspect ratio.
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology
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