Gold-thickness-dependent Schottky Barrier Height for Charge Transfer in Metal-Assisted Chemical Etching of Silicon

Zewen Zuo,Guanglei Cui,Yi Shi,Yousong Liu,Guangbin Ji
DOI: https://doi.org/10.1186/1556-276x-8-193
2013-01-01
Nanoscale Research Letters
Abstract:Large-area, vertically aligned silicon nanowires with a uniform diameter along the height direction were fabricated by combining in situ-formed anodic aluminum oxide template and metal-assisted chemical etching. The etching rate of the Si catalyzed using a thick Au mesh is much faster than that catalyzed using a thin one, which is suggested to be induced by the charge transport process. The thick Au mesh in contact with the Si produces a low Au/Si Schottky barrier height, facilitating the injection of electronic holes from the Au to the Si, thus resulting in a high etching rate.
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