Abstract:We propose a novel microscopy method, combining surface wave illumination and the Fourier ptychographic microscopy (FPM) algorithm to achieve super-resolution (SR) imaging. In our system, an oil-immersion objective lens is used to excite both the total internal reflection (TIR) evanescent waves and the surface plasmon waves (SPWs), which illuminate the sample with large wave vectors. Through the FPM algorithm, a resolution approximately twice that of conventional wide-field microscopy is obtained. Meanwhile, we could retrieve the sample's quantitative phase map in order to obtain its surface profile. Importantly, the field enhancement from a SPW has improved the contrast of the reconstructed images, which is critical for revealing the finer structural details of the specimen. In our experiments, we have imaged metallic gratings with a 120 or 150 nm wide line and trench features. We accurately retrieved their axial dimensions with a lateral resolution better than 240 nm that is close to the theoretical resolution of 215 nm, thus demonstrating the quantitative phase imaging capability of our technique. As this approach provides a label-free solution for intensity and phase imaging of samples with lateral resolution exceeding the limit introduced by the optical system, it can be potentially used in a wide range of noninvasive biological imaging applications. (C) 2016 Optical Society of America.

Substrate-mediated Multiwave Resonance Grazing Incidence X-Ray Diffraction in Thin Films: A Method for Direct Phase Determination

Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

Direct Determination Of X-Ray Reflection Phases

Direct Determination of Resonance Phase Shifts of Soft X-Ray Diffraction in Thin Films by Momentum-Transfer-Sensitive Three-Wave Interference

Surface wave illumination Fourier ptychographic microscopy.

Realizing In-Plane Surface Diffraction by X-Ray Multiple-Beam Diffraction with Large Incidence Angle

Direct determination of X-Ray reflection phases for noncentrosymmetric crystals

Quasi-universality and scaling behaviour of three-wave X-ray interference in crystals: A novel way for the quantitative determination of X-ray reflection phases

Solving The X-Ray Phase Problem For Macromolecular Crystals By Multi-Wave X-Ray Interference

Direct Experimental Method for the Determination of X-Ray Reflection Phases

Theoretical Consideration of Experimental Methods for X-Ray Phase Determination Using Multiple Diffraction

Determination of Three-Dimensional Interfacial Strain — A Novel Method of Probing Interface Structure with X-ray Bragg-surface Diffraction

Single-image Phase Retrieval for Hard X-ray Grating Interferometry

Multiwavelength Shearing Interferometry for Measuring the Slopes, Curvatures, and Shapes of Thin Films/substrate Systems.

Determination of the interface structural morphology from grazing-incidence X-ray diffraction data using dynamical theory

Three-dimensional coherent X-ray surface scattering imaging near total external reflection

Phase calculation of smooth surface with multi-reflectivity based on phase measurement deflectometry.

Solution to the X-ray Phase Problem Using Multiple Diffraction—a Review

X-ray scattering methods for films and multilayers and their applications

Study on Extraction Method of Phase Information in X-Ray Diffraction Enhanced Imaging