Abstract:We propose a novel microscopy method, combining surface wave illumination and the Fourier ptychographic microscopy (FPM) algorithm to achieve super-resolution (SR) imaging. In our system, an oil-immersion objective lens is used to excite both the total internal reflection (TIR) evanescent waves and the surface plasmon waves (SPWs), which illuminate the sample with large wave vectors. Through the FPM algorithm, a resolution approximately twice that of conventional wide-field microscopy is obtained. Meanwhile, we could retrieve the sample's quantitative phase map in order to obtain its surface profile. Importantly, the field enhancement from a SPW has improved the contrast of the reconstructed images, which is critical for revealing the finer structural details of the specimen. In our experiments, we have imaged metallic gratings with a 120 or 150 nm wide line and trench features. We accurately retrieved their axial dimensions with a lateral resolution better than 240 nm that is close to the theoretical resolution of 215 nm, thus demonstrating the quantitative phase imaging capability of our technique. As this approach provides a label-free solution for intensity and phase imaging of samples with lateral resolution exceeding the limit introduced by the optical system, it can be potentially used in a wide range of noninvasive biological imaging applications. (C) 2016 Optical Society of America.

Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

Substrate-mediated Multiwave Resonance Grazing Incidence X-Ray Diffraction in Thin Films: A Method for Direct Phase Determination

Surface wave illumination Fourier ptychographic microscopy.

Direct Determination Of X-Ray Reflection Phases

Direct determination of X-Ray reflection phases for noncentrosymmetric crystals

Direct Experimental Method for the Determination of X-Ray Reflection Phases

Realizing In-Plane Surface Diffraction by X-Ray Multiple-Beam Diffraction with Large Incidence Angle

Direct Determination of Resonance Phase Shifts of Soft X-Ray Diffraction in Thin Films by Momentum-Transfer-Sensitive Three-Wave Interference

Reflection Surface X-Ray Diffraction Patterns: K-Space Images

Quasi-universality and scaling behaviour of three-wave X-ray interference in crystals: A novel way for the quantitative determination of X-ray reflection phases

Three-dimensional coherent X-ray surface scattering imaging near total external reflection

Time-resolved reflection surface x-ray diffraction

Theoretical Consideration of Experimental Methods for X-Ray Phase Determination Using Multiple Diffraction

Solving The X-Ray Phase Problem For Macromolecular Crystals By Multi-Wave X-Ray Interference

Three-Wave X-Ray Diffraction: an Analysis Scheme of the Sensitivity in Determining Triplet Phase Invariants

Reflection of X-Rays from A Rough Surface at Extremely Small Grazing Angles

X-ray reflectivity with a twist: quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

Three Dimensional Imaging using Coherent X-Rays at Grazing Incidence Geometry

Direct Observation of Resonance Fringes in X-ray Cavity: a Diffraction Experiment

Probing three-dimensional mesoscopic interfacial structures in a single view using multibeam X-ray coherent surface scattering and holography imaging

X-Ray Standing Waves at the Total Reflection Condition: Direct Method and Coherence Effects