Abstract:A direct scheme has been developed for crystal and surface structure determination. This scheme is based on a partition of the crystal potential V(r) into a known part V-0(r) and a perturbation delta V(r), i.e. V(r) = V-0(r)+delta V(r). The full dynamical electron diffraction theory is used for treating the dynamical electron diffraction by V-0(r) and perturbation theory is used for dealing with the residual scattering by delta V(r). It is shown that this partition is applicable for a wide range of situations of practical importance, including scattering by the re-distributed valence electrons and by a reconstructed surface layer. In some favourable cases, when the crystal thickness is not exceedingly large and atomic displacements from the known structure giving rise to V-0(r) are small(as in the case of structure refinement), crystal structure factors and crystal and surface structure can be directly inverted from dynamical diffraction data. Both the perturbation method and the direct scheme have been extensively tested, and in particular the direct scheme has been used successfully to invert crystal structure factors directly from experimental CBED data obtained from a single crystal of MgO. (C) 1997 Elsevier Science Ltd.

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Qantitative Determination of Phase for Macromolecular Crystals Using Multiple Diffraction Methods and Dynamical Theory

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Solution to the X-ray Phase Problem Using Multiple Diffraction—a Review

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Solving The X-Ray Phase Problem For Macromolecular Crystals By Multi-Wave X-Ray Interference

Kramers-Kronig relations in three-beam x-ray diffraction: Application to phase determination

Quasi-universality and scaling behaviour of three-wave X-ray interference in crystals: A novel way for the quantitative determination of X-ray reflection phases

X-Ray Multiple Diffraction and the Invariant Phases of Structure Factors

Realizing In-Plane Surface Diffraction by X-Ray Multiple-Beam Diffraction with Large Incidence Angle

Direct Determination of Resonance Phase Shifts of Soft X-Ray Diffraction in Thin Films by Momentum-Transfer-Sensitive Three-Wave Interference

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Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples

Direct single-shot phase retrieval from the diffraction pattern of separated objects

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Differential internal multi-reflection method for nano-displacement measurement

Direct Retrieval of Crystal and Surface Structures Using High Energy Electrons