Abstract:Optical, electronic and structural properties of nanocrystals fundamentally derive from crystal phase. This is especially important for polymorphic II–VI, III–V and I-III-VI2 semiconductor materials such as cadmium selenide, which exist as two stable phases, cubic and hexagonal, each with distinct properties. However, standard crystallographic characterization through diffraction yields ambiguous phase signatures when nanocrystals are small or polytypic. Moreover, diffraction methods are low-throughput, incompatible with solution samples and require large sample quantities. Here we report the identification of unambiguous optical signatures of cubic and hexagonal phases in II–VI nanocrystals using absorption spectroscopy and first-principles electronic-structure theory. High-energy spectral features allow rapid identification of phase, even in small nanocrystals (∼2 nm), and may help predict polytypic nanocrystals from differential phase contributions. These theoretical and experimental insights provide simple and accurate optical crystallographic analysis for liquid-dispersed nanomaterials, to improve the precision of nanocrystal engineering and improve our understanding of nanocrystal reactions.

Direct determination of X-Ray reflection phases for noncentrosymmetric crystals

Direct Determination Of X-Ray Reflection Phases

Direct Experimental Method for the Determination of X-Ray Reflection Phases

Theoretical Consideration of Experimental Methods for X-Ray Phase Determination Using Multiple Diffraction

Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

Substrate-mediated Multiwave Resonance Grazing Incidence X-Ray Diffraction in Thin Films: A Method for Direct Phase Determination

Direct Determination of Resonance Phase Shifts of Soft X-Ray Diffraction in Thin Films by Momentum-Transfer-Sensitive Three-Wave Interference

Quasi-universality and scaling behaviour of three-wave X-ray interference in crystals: A novel way for the quantitative determination of X-ray reflection phases

X-Ray Multiple Diffraction and the Invariant Phases of Structure Factors

Method for Identifying Crystalline Phases in X-ray Diffraction Data from Multiphase Samples

Qantitative Determination of Phase for Macromolecular Crystals Using Multiple Diffraction Methods and Dynamical Theory

Solving Non-Periodic Structures Using Direct Methods: Phasing Diffuse Scattering

Solving The X-Ray Phase Problem For Macromolecular Crystals By Multi-Wave X-Ray Interference

Solution of the phase problem in the theory of structure determination of crystals from x-ray diffraction experiments

Solution to the X-Ray Phase Problem for Acentric Crystals

Phasing Diffuse Scattering. Application of the SIR2002 Algorithm to the Non-Crystallographic Phase Problem.

Optical determination of crystal phase in semiconductor nanocrystals

Solution to the X-ray Phase Problem Using Multiple Diffraction—a Review

Kramers-Kronig relations in three-beam x-ray diffraction: Application to phase determination

Direct Method of Determining the Lattice Parameters of a Phase from X-ray Diffraction Pattern of Multi-Phase

Solving the Crystallographic Phase Problem using Dynamical Scattering in Electron Diffraction