Abstract:To obtain spatial information about an arbitrary atomic distribution in x-ray structure analysis, e.g., in molecules or proteins, the standard method is to measure the intensity in the far field, i.e., the first-order photon correlation function of the coherently scattered x-ray photons (coherent diffractive imaging). Recently, it was suggested to record alternatively the incoherently scattered photons and measure the second-order photon correlation function to reconstruct the geometry of the unknown atomic distribution (incoherent diffractive imaging). Yet, besides various advantages of the latter method, both techniques suffer from the so-called phase retrieval problem. Lately, an ab-initio phase retrieval algorithm to reconstruct the phase of the so-called structure factor of the scattering objects based on the third-order photon correlation function was reported. The algorithm makes use of the closure phase, which contains important, yet incomplete phase information, well-known from triple correlations and their bispectrum in speckle masking and astronomy applications. Here, we provide a detailed analysis of the underlying scheme and quantities in the context of x-ray structure analysis. In particular, we explicitly calculate for the first time the third-order photon correlation function for single photon emitters in a full quantum mechanical treatment and discuss the uniqueness of the closure phase equations constructed from. In this context, we recapitulate the sign problem of the closure phase and how it can be lifted using redundant information. We further show how the algorithm can be improved using even higher-order photon correlation functions produced by single photon emitters, e.g., the fourth-order correlation function, delivering new phase relations appearing in the four-point correlations.

Quasi-universality and scaling behaviour of three-wave X-ray interference in crystals: A novel way for the quantitative determination of X-ray reflection phases

X-Ray Multiple Diffraction and the Invariant Phases of Structure Factors

Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

Solving The X-Ray Phase Problem For Macromolecular Crystals By Multi-Wave X-Ray Interference

Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

Direct Determination Of X-Ray Reflection Phases

Theoretical Consideration of Experimental Methods for X-Ray Phase Determination Using Multiple Diffraction

Direct determination of X-Ray reflection phases for noncentrosymmetric crystals

Substrate-mediated Multiwave Resonance Grazing Incidence X-Ray Diffraction in Thin Films: A Method for Direct Phase Determination

The diffraction power of crystals with unknown atomic structures: calculation and application in quantitative phase analysis

Qantitative Determination of Phase for Macromolecular Crystals Using Multiple Diffraction Methods and Dynamical Theory

Three-Wave X-Ray Diffraction: an Analysis Scheme of the Sensitivity in Determining Triplet Phase Invariants

An Algorithm for Calculating Diffraction Profiles of 2θ Scans for Multiple Diffraction from Crystals and Thin Films

Enhanced coherent interaction in four-beam X-ray interference in crystals: a solution to the X-ray phase problem using weak four-beam diffraction

Kramers-Kronig relations in three-beam x-ray diffraction: Application to phase determination

Solution to the X-ray Phase Problem Using Multiple Diffraction—a Review

Unified Formulation of X-Ray Diffraction and Refraction

Phase Retrieval in Incoherent Diffractive Imaging using higher-order photon correlation functions

"Ultima Ratio": Simulating wide-range X-ray scattering and diffraction

Direct Experimental Method for the Determination of X-Ray Reflection Phases

A Quantum Approach to X-ray Multiple Diffraction