Abstract:The latest development of ultrafast free electron laser makes it now possible to perform single molecule diffraction imaging. In such an experiment, two-dimensional (2D) diffraction images of randomly oriented molecules of the same type (single molecules) can be captured within femtosecond exposure time. These images can then be used to deduce the 3D structure of the molecule. Two of the most challenging problems that must be solved in order to obtain a high resolution 3D reconstruction are: 1) the determination of the relative orientations of 2D diffraction images; 2) the retrieval of the phase information of a reconstructed 3D diffraction pattern. In this paper, we will focus on the first problem and discuss the use of common curve detection techniques to deduce the relative orientations of 2D diffraction images produced from single-molecule diffraction experiments. Such a technique is based on the fact that Ewald spheres associated with two diffraction images of the same molecule intersect along a common curve in the reciprocal space. By detecting these curves on each diffraction image, we can deduce the relative orientations of diffraction images by solving an eigenvalue problem. When the radius of the Ewald sphere is sufficiently large relatively to the region of reciprocal space we are interested in, the Ewald sphere becomes flat near the origin of the reciprocal space, and common curves reduce to common lines. In this case, the orientation determination problem is similar to the one that arises in single particle cryo-electron microscopy. The recent work of Singer and Shkolnisky [1] shows that the orientation determination problem can be solved by computing the largest eigenvalues of a symmetric matrix constructed from the common lines identified among cryo-EM projection images. In this paper, we will extend their technique to diffraction images on which common curves can be identified.

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Measurement of Absolute Phase Shift on Reflection of Thin Films Using White-Light Spectral Interferometry

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Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

Direct determination of X-Ray reflection phases for noncentrosymmetric crystals

High Resolution Synchrotron Extended X-Ray Absorption Fine Structure and Infrared Spectroscopy Analysis of MBE Grown CdTe/InSb Epifilms

Determination of Three-Dimensional Interfacial Strain — A Novel Method of Probing Interface Structure with X-ray Bragg-surface Diffraction

Direct Determination Of X-Ray Reflection Phases

Band Shift of Pb1-Xsrx Te Thin Film and Its Band Alignment Using Synchrotron Radiation Photoelectron Spectroscope

Phase Transition Kinetics of Sb(2)Te(3) Phase Change Thin Films

Direct measurement of photoinduced transient conducting state in multilayer 2H-MoTe2

Dynamic Diffraction Effects and Coherent Breathing Oscillations in Ultrafast Electron Diffraction in Layered 1T-Tasete

THE OPTICAL AND ELECTRICAL-PROPERTIES OF TE-IN-SB FILMS DURING THEIR PHASE-TRANSITION

Concurrent probing of electron-lattice dephasing induced by photoexcitation in 1T-TaSeTe using ultrafast electron diffraction

Temperature- and energy-dependent phase shifts of resonant multiple-beam X-ray diffraction in germanium crystals.

Determination of Bond Lengths and Electronic Structure of Cd1-xZnxTe Ternary Alloys by Synchrotron Radiation

Direct Experimental Method for the Determination of X-Ray Reflection Phases

Imaging nonequilibrium atomic vibrations with x-ray diffuse scattering

Theoretical Consideration of Experimental Methods for X-Ray Phase Determination Using Multiple Diffraction

Synchrotron Radiation X-Ray Absorption Fine-Structure and Raman Studies on CdZnTe Ternary Alloys

Orientation Determination for 3d Single Molecule Diffraction Imaging