Abstract:Electron crystallography is a unique technique for structure analysis of crystals too small to be studied by single-crystal X-ray diffraction, even using a synchrotron radiation.Many different structures including the most complicated zeolites and quasicrystal approximants have been solved by electron diffraction (ED) and high-resolution transmission electron microscopy (HRTEM) combined with crystallographic image processing.[1] Even though, electron crystallography is not widely used for structure analysis compared to X-ray diffraction.The main reasons for this are 1) dynamical scattering; 2) incomplete data and 3) the techniques are not feasible and highly skilful operators are needed.The later often requires a long and hard training period.We have developed several new methods to tackle those problems.Dynamical scattering may be reduced when the incident electron beam is tilted off the zone axes.This is achieved in precession electron diffraction (PED).We have developed a new software-based method -the digital sampling method to automatically collect a series of ED frames while the electron beam is precessed.[2]Several different post-processing strategies are developed for extracting the ED data and combining them to a PED pattern.The intensity data obtained by the digital sampling method were used for structure refinement of K 2 O⋅7Nb 2 O 5 .The data quality is shown to be comparable to, and in some cases even better than that obtained using a hardware-based electron precession device.We have combined digital electron beam rotations with goniometer tilts for collecting complete 3D electron diffraction data.[3]A 3D electron diffraction dataset with an tilt range of ± 70° can be collected automatically from a nanosized crystal on a JEOL JEM2100 TEM.More than one thousand electron diffraction patterns can be collected within 1-2 hours, with a step of 0.05° -0.1° for each ED frame.There is no need for pre-alignment of the crystal.The ED patterns are combined into a 3D reciprocal lattice, from which the unit cell parameters and space group can be determined.ED intensities of all reflections can be extracted and used for structure solution and refinement.Diffuse scattering and diffraction streaks caused by crystal defects can be quantified and used for studying the defect structures in the crystals.The power of the new methods for structure analysis is demonstrated on several inorganic structures and zeolites.The automation procedure for collection of complete 3D ED data from nano-sized crystals opens new possibilities and applications of electron diffraction for structure analysis.

Kinematic and Dynamical CBED for Solving Thin Organic Films at Low Temperature; Experimental Tests with Anthracene.

Low-Dose, Low-Temperature Convergent-Beam Electron Diffraction and Multiwavelength Analysis of Hydrocarbon Films by Electron Diffraction

Electron Microscopy and Diffraction of Crystalline Dendrimers and Macrocycles

Seeing Structural Evolution of Organic Molecular Nano-crystallites Using 4D Scanning Confocal Electron Diffraction

Accurate structure models and absolute configuration determination using dynamical effects in continuous-rotation 3D electron diffraction data

Solving the Crystallographic Phase Problem using Dynamical Scattering in Electron Diffraction

Observations of specimen morphology effects on near‐zone‐axis convergent‐beam electron diffraction patterns

XAFS Studies of Solution-Phase Complexes of Cesium with Dibenzo-18-crown-6 Ethers

Potentials of individual atoms by convergent beam electron diffraction

CONTINUOUS ROTATIONAL ELECTRON DIFFRACTION METHOD FOR STRUCTURE DETERMINATION OF SMALL ORGANIC MOLECULES

Investigation of Medium to High Strain Deformation Microstructures Using an Automated Electron Backscattering Pattern (EBSP) System

Direct Retrieval of Crystal-Structure Factors in Theed

Testing the Simplified Molecular Dynamics Approach to Improve the Reproduction of ECD Spectra and Monitor Aggregation

Complete 3D Electron Diffraction Data Collection - New Methods and Applications

Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM

Thickness Dependent Electron-Lattice Equilibration in Thin Bi Films Studied by Time-Resolved MeV Electron Diffraction

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope

High Temperature Electron Diffraction on Organic Crystals: In Situ Crystal Structure Determination of Pigment Orange 34

On the Validity of the Direct Phasing and Fourier Method in Electron Crystallography

Direct Determination of Resonance Phase Shifts of Soft X-Ray Diffraction in Thin Films by Momentum-Transfer-Sensitive Three-Wave Interference

Surface Structural Sensitivity Of Convergent-Beam Rheed: Si (001)2x1 Models Compared With Dynamical Simulations