Abstract:The conventional surface x-ray diffraction method [1] allows us to determine atomic arrangements of crystal surfaces and interfaces.While x-ray diffraction intensities distributed within a reciprocal lattice space are usually measured with a finetooth comb using the method, an overall image of the diffraction intensity profile is difficult to get until after such lengthy and time consuming measurement is completed.We proposed x-ray reciprocal-lattice space imaging method (X-ReSI) for straightforward understanding of 1D nanostructures such as NiO nanowires [2].The X-ReSI is a single-exposure diffraction technique which records the reciprocallattice pattern of a fixed crystalline nanostructure using a 2D detector.The fundamental idea behind the method is that the reciprocal lattice of 1D or 2D structures are an array of sheets or rods, respectively.Thus the reciprocal-lattice space can be recorded for a fixed sample with a 2D x-ray detector fixed.The typical exposure time is a few seconds to a few minutes using the 3rd generation x-ray source.We applied the method to structural evaluation of Bi nanolines being 1/8 monolayers in coverage on average.The results of the application reveal that Bi nanolines embeded in Si was found to have a 2 x n superstructure having Bi dimer bonds [3].On the other hand line structures in samples capped with an amorphous Si layer and having no cap layers still remained with a non-detectable amount of the 2 x n atomic structures.Other applications are structural determination of a Bi4Ti3O12 thinfilm and in-situ observation of a Au electrode in H2SO4.

Reflection Surface X-Ray Diffraction Patterns: K-Space Images

A Study of Rheed Pattern from the Epitaxial Growth of Si-Ge Crystal

Time-resolved reflection surface x-ray diffraction

Monitoring growth with X-ray diffraction

Three-Wave Resonance Grazing Incidence X-Ray Diffraction: A Novel Method for Direct Phase Determination of Surface In-Plane Reflections

Geometric Analysis of Surface Resonance Conditions in Reflection High Energy Electron Diffraction

Realizing In-Plane Surface Diffraction by X-Ray Multiple-Beam Diffraction with Large Incidence Angle

Reflection High-Energy Electron Diffraction Measurements of Reciprocal Space Structure of 2D Materials

Experimental Studies of Surface Resonance Scattering Processes in Rheed

Bragg-surface Three-Beam Dynamical X-ray Diffraction

Quasi-kinematic Low-Energy Electron Diffraction and Its Latest Applications

Quantitative Agreement Between Dynamical Rocking Curves in Ultrafast Electron Diffraction for X-Ray Lasers.

Correlated Diffuse X-ray Scattering from Periodically Nano-Structured Surfaces

Surface structural sensitivity of convergent-beam RHEED: Si (0 0 1) 2×1 models compared with dynamical simulations

Investigation of the atomic structure of surfaces by means of forward scattering of medium energy electrons

X-ray reflectivity with a twist: quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

Studies of Fesi2/Si Quantum Dot Nano-Structures by X-Ray Bragg-Surface Diffractions (Bsd)

X-ray diffraction studies of miscut crystal surfaces and overlayers: a dynamical diffraction approach

Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope

Realistic simulation of reflection high-energy electron diffraction patterns for two-dimensional lattices using Ewald construction

Three-dimensional coherent X-ray surface scattering imaging near total external reflection