Abstract:The conventional surface x-ray diffraction method [1] allows us to determine atomic arrangements of crystal surfaces and interfaces.While x-ray diffraction intensities distributed within a reciprocal lattice space are usually measured with a finetooth comb using the method, an overall image of the diffraction intensity profile is difficult to get until after such lengthy and time consuming measurement is completed.We proposed x-ray reciprocal-lattice space imaging method (X-ReSI) for straightforward understanding of 1D nanostructures such as NiO nanowires [2].The X-ReSI is a single-exposure diffraction technique which records the reciprocallattice pattern of a fixed crystalline nanostructure using a 2D detector.The fundamental idea behind the method is that the reciprocal lattice of 1D or 2D structures are an array of sheets or rods, respectively.Thus the reciprocal-lattice space can be recorded for a fixed sample with a 2D x-ray detector fixed.The typical exposure time is a few seconds to a few minutes using the 3rd generation x-ray source.We applied the method to structural evaluation of Bi nanolines being 1/8 monolayers in coverage on average.The results of the application reveal that Bi nanolines embeded in Si was found to have a 2 x n superstructure having Bi dimer bonds [3].On the other hand line structures in samples capped with an amorphous Si layer and having no cap layers still remained with a non-detectable amount of the 2 x n atomic structures.Other applications are structural determination of a Bi4Ti3O12 thinfilm and in-situ observation of a Au electrode in H2SO4.

Studies of Fesi2/Si Quantum Dot Nano-Structures by X-Ray Bragg-Surface Diffractions (Bsd)

Study Of The Na-Si(111) 3x1 Interface Using Core-Level Photoemission Spectroscopy

Interfacial Bonding and Structure of Bi2te3 Topological Insulator Films on Si(111) Determined by Surface X-Ray Scattering

Single-mode Dynamic X-ray Diffraction for Si and Si Nanowires on Si

Measuring Lattice Parameter of Iron Silicides Using X-Ray Bragg-surface Diffraction

Depth profiles of the interfacial strains of Si 0.7 Ge 0.3 /Si using three-beam Bragg-surface diffraction

X-ray Diffraction Studies of Trilayer Oscillations in the Preferred Thickness of in Films on Si(111)

Nanoscale characterization of bismuth telluride epitaxic layers by advanced X-ray analysis

Structure Identification of Two-Dimensional Colloidal Semiconductor Nanocrystals with Atomic Flat Basal Planes.

Reflection Surface X-Ray Diffraction Patterns: K-Space Images

Realizing In-Plane Surface Diffraction by X-Ray Multiple-Beam Diffraction with Large Incidence Angle

Investigation of the Surface Stress in SiC Nanocrystals by In-situ High Pressure Powder Diffraction Technique

Nanoimaging of Electronic Heterogeneity in Bi2Se3 and Sb2Te3 Nanocrystals

Phase Transformation-Induced Quantum Dot States on the Bi/Si(111) Surface

Imaging and Diffraction Characterisation of 2D Inorganic Nanostructures

Synchrotron radiation x-ray photoelectron spectroscopy of Si nanocrystals grown onto Al2O3∕Si surfaces

High-resolution surface structure determination from bulk X-ray diffraction data

Surface structure of the 3x3-Si phase on Al(111), studied by the multiple usages of positron diffraction and core-level photoemission spectroscopy

Studies of the High Temperature Nitridation Structures of the Si(111) Surface by LEED, AES and EELFS

Nano-infrared imaging of epitaxial graphene on SiC revealing doping and thickness inhomogeneities

Co-induced nano-structures on Si(111) surface