Determination of the interface structural morphology from grazing-incidence X-ray diffraction data using dynamical theory

Tsai-Sheng Gau,Hung-Chun Chien,Shih-Lin Chang,Mei-Yen Li,Maw-Kuen Wu
DOI: https://doi.org/10.1016/S0039-6028(97)00228-8
IF: 1.9
1997-01-01
Surface Science
Abstract:A scheme based on X-ray dynamical theory is developed to analyze grazing-incidence X-ray diffraction data and to determine the interface structural morphology efficiently with a number of fitting parameters related to the phases and magnitude of the electric susceptibilities. This scheme is applied to surface normal-scans to study the relatively complex interface structure of the YSZ/MgO(001) system. II is found that the interface is composed of three types of crystallites of the c-elongated tetragonal structure with thicknesses of about 300, 150 and 50 Angstrom in the direction normal to the interface. The related structural parameters are also deduced. (C) 1997 Elsevier Science B.V.
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