Room Temperature Photoluminescence from Erbium-Doped Silica Thin Films Prepared by Cosputtering

Gang Gu,Youwei Du,Tony Fu‐Lai Yu
DOI: https://doi.org/10.1016/s0040-6090(97)00789-x
IF: 2.1
1998-01-01
Thin Solid Films
Abstract:The Er3+ ions were dispersed in silica matrix by rf magnetron cosputtering of silica and erbium oxide. Photoluminescence of Er3+ centered at 1.534 μm has been detected at room temperature as excited by a Nd-YAG laser line at 1.064 μm. The photoluminescence intensity is proportional to the annealing temperature. We believe that it is due to more radiative centers reaching Er3+ upon annealing. Besides the main peak at 1.534 μm, an additional peak at 1.522 μm was observed, which is considered to result from the Raman response of surface hydrogen bonds.
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