High-quality AlN Epitaxy on Nano-Patterned Sapphire Substrates Prepared by Nano-Imprint Lithography

Lisheng Zhang,Fujun Xu,Jiaming Wang,Chenguang He,Weiwei Guo,Mingxing Wang,Bowen Sheng,Lin Lu,Zhixin Qin,Xinqiang Wang,Bo Shen
DOI: https://doi.org/10.1038/srep35934
IF: 4.6
2016-01-01
Scientific Reports
Abstract:We report epitaxial growth of AlN films with atomically flat surface on nano-patterned sapphire substrates (NPSS) prepared by nano-imprint lithography. The crystalline quality can be greatly improved by using the optimized 1-μm-period NPSS. The X-ray diffraction ω-scan full width at half maximum values for (0002) and (10 2) reflections are 171 and 205 arcsec, respectively. The optimized NPSS contribute to eliminating almost entirely the threading dislocations (TDs) originating from the AlN/sapphire interface via bending the dislocations by image force from the void sidewalls before coalescence. In addition, reducing the misorientations of the adjacent regions during coalescence adopting the low lateral growth rate is also essential for decreasing TDs in the upper AlN epilayer.
What problem does this paper attempt to address?