Epitaxial growth of TiC on (0001) 4H-SiC substrate by reactive sputtering

Kun-An Chiu,Jing-Feng Lin,Kuan-Yu Lin,Ping-Hsun Wu,Hsueh-I Chen,Cheng-Jung Ko,Chun-Hua Chen,Li Chang
DOI: https://doi.org/10.1016/j.tsf.2023.139874
IF: 2.1
2023-01-01
Thin Solid Films
Abstract:•Epitaxial (111) TiC film was deposited on 4° off-angle 4H-SiC (0001) by sputtering.•The FWHM of X-ray rocking curve of TiC (111) is 0.039°.•TiC film with a low resistivity in 80 μΩ⋅cm can be obtained.•Growth of a thick film may result in formation of a relaxed top layer.
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