Study of Heteroepitaxial 4H-SiC Films Growth on AlN/Si(111) Substrates by CVD

Wu Jun,Wang Ronghua,Han Ping,Mei Qin,Liu Bin,Xie Zili,Xiu Xiangqian,Zhang Rong
2008-01-01
Abstract:The 4H-SiC films heteroepitaxially deposited on AlN/Si(111)substrates by chemical vapor deposition(CVD)were investigated.High-resolution X-ray diffraction(HRXRD),scanning electron microscope(SEM)and Raman scattering were used to analyze the crystallographic properties and surface morphology of these SiC films.The XRD spectrum shows that the SiC films have single(0006)orientation.The spectrum of Raman scattering indicates that the type of the prepared SiC films is 4H.It is found that lower substrate temperature is not beneficial for Si and C atoms to select the proper sites,leading to poor crystalline quality.While higher substrate temperature enhances the etching effect of H2 and desorption of absorbed atoms,which goes against the film growth.In addition,the ratio of C/Si influences on the growth of SiC as well.Excess Si results droplets on the surface,while excess C causes Si vacancies in the material.These experiments show that the preferred substrate temperature for 4H-SiC heteroepitaxy is at 1 230-1 270 ℃,the proper ratio of C/Si equals to 1.3.
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