On the Study of the Orientated Cracks Formed in ErD2 Thin Film

H. Shen,K. Sun,X. Xiang,X. Zu
DOI: https://doi.org/10.1017/s1431927613011276
IF: 4.0991
2013-01-01
Microscopy and Microanalysis
Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
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