3D Non-Destructive Grain Orientation Mapping of Polycrystalline Materials Using 3D-XRD and TEM

X. Huang,H.F. Poulsen,S. Schmidt,H.H. Liu,A. Godfrey
DOI: https://doi.org/10.1017/s1431927612005491
IF: 4.0991
2012-01-01
Microscopy and Microanalysis
Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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