Abstract:Journal Article Determination of Reliable Grain Boundary Orientation using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope Get access Xinming Zhang, Xinming Zhang Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Jorgen F Rufner, Jorgen F Rufner Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Thomas LaGrange, Thomas LaGrange Physical and Life Sciences Directory, Lawrence Livermore National Laboratory, 7000 East Ave, Livermore, CA 94550 USAnow at: Ecole Polytechnique Federale de Lausanne, Interdisciplinary Center of Electron Microscopy, 1015 Lausanne, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Ricardo HR Castro, Ricardo HR Castro Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Julie M Schoenung, Julie M Schoenung Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Geoffrey H Campell, Geoffrey H Campell Physical and Life Sciences Directory, Lawrence Livermore National Laboratory, 7000 East Ave, Livermore, CA 94550 USA Search for other works by this author on: Oxford Academic Google Scholar Klaus van Benthem Klaus van Benthem Department of Chemical Engineering and Materials Science, University of California, Davis, CA 95616 USA Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1663–1664, https://doi.org/10.1017/S1431927615009095 Published: 23 September 2015

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Determination of Reliable Grain Boundary Orientation Using Automated Crystallographic Orientation Mapping in the Transmission Electron Microscope