Electron Ptychographic Microscopy For Three-Dimensional Imaging

Si Gao,Peng Wang,Fucai Zhang,Gerardo T. Martinez,Peter D. Nellist,Xiaoqing Pan,Angus I. Kirkland
DOI: https://doi.org/10.1038/s41467-017-00150-1
IF: 16.6
2017-01-01
Nature Communications
Abstract:Knowing the three-dimensional structural information of materials at the nanometer scale is essential to understanding complex material properties. Electron tomography retrieves three-dimensional structural information using a tilt series of two-dimensional images. In this paper, we report an alternative combination of electron ptychography with the inverse multislice method. We demonstrate depth sectioning of a nanostructured material into slices with 0.34 nm lateral resolution and with a corresponding depth resolution of about 24-30 nm. This three-dimensional imaging method has potential applications for the three-dimensional structure determination of a range of objects, ranging from inorganic nanostructures to biological macromolecules.
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