Abstract:The precise estimation of the operational lifespan of insulated gate bipolar transistors (IGBT) holds paramount significance for ensuring the efficient and uncompromised safety of industrial equipment. However, numerous methodologies and models currently employed for this purpose often fall short of delivering highly accurate predictions. The analytical approach that combines the Pattern Optimization Algorithm (POA) with Successive Variational Mode Decomposition (SVMD) and Bidirectional Long Short-term Memory (BiLSTM) network is introduced. Firstly, SVMD is employed as an unsupervised feature learning method to partition the data into intrinsic modal functions (IMFs), which are used to eliminate noise and preserve the essential signal. Secondly, the BiLSTM network is integrated for supervised learning purposes, enabling the prediction of the decomposed sequence. Additionally, the hyperparameters of BiLSTM and the penalty coefficients of SVMD are optimized utilizing the POA technique. Subsequently, the various modal functions are predicted utilizing the trained prediction model, and the individual mode predictions are subsequently aggregated to yield the model's definitive final life prediction. Through case studies involving IGBT aging datasets, the optimal prediction model was formulated and its lifespan prediction capability was validated. The superiority of the proposed method is demonstrated by comparing it with benchmark models and other state-of-the-art methods.

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Combating NBTI-induced aging in data caches.