Abstract:The insulated gate bipolar transistor (IGBT) is widely utilized in the transportation, power, and energy domains because of its high input impedance and minimal on-voltage drop. IGBTs are frequently used in industrial applications for lengthy periods of time, collecting fatigue damage and eventually aging and failing, which can result in system shutdown and financial losses in severe circumstances. As a result, a study into the IGBT's reliability is extremely important. Fault prediction technology, which is an important aspect of reliability research, may analyze device state through changes in terminal parameters, anticipate aging trends, and issue early warnings at thresholds to avoid significant safety issues caused by IGBT aging failures. Therefore, the appropriate end parameters are selected as aging characteristic parameters, and fault prediction is performed. Therefore, this paper has carried out research on the IGBT fault prediction technology that integrates the terminal characteristics and artificial intelligence neural network. The main research contents include the following: (1) this paper starts from the basic principle of IGBT and the structure of its device and analyzes its failure mode on the failure of IGBT. The characteristic parameter of collector-emitter turn-off peak voltage value is selected for IGBT fault prediction, and the aging data of NASA PCoE Research Center is used to verify that the characteristic parameter can be used for fault prediction. (2) In view of the shortcomings of traditional fault forecasting methods, this paper proposes to use deep learning time series forecasting methods for fault forecasting. The LSTM is theoretically analyzed, and the prediction network is built. The experimental results show that the LSTM network model can improve the accuracy of IGBT fault prediction, with fewer parameters and higher prediction efficiency.

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