An Aging Small-signal Modeling Method of Microwave Transistors Using GA-ELM Neural Network

Lin Cheng,Hongliang Lu,Xiuxiu Guo,Silu Yan,Wei Cheng,Yuming Zhang
DOI: https://doi.org/10.1109/iseda59274.2023.10218508
2023-01-01
Abstract:In this paper, an aging small-signal S-parameters modeling method for microwave transistors is explored using a genetic algorithm (GA) to optimize the Extreme Learning Machine (ELM) neural network. A dual GA-ELM neural network architecture was used to simulate the fresh S-parameters of InP heterojunction bipolar transistor (HBT) devices and the degradation of S-parameters after accelerated aging, respectively. Good agreement was achieved between measured and predicted results of the fresh and aging S-parameters within a frequency range of 0.1 to 40 GHz.
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