Bismuth Doped Znse Films Fabricated on Silicon Substrates by Pulsed Laser Deposition

Yiqun Shen,Ning Xu,Wei Hu,Xiaofeng Xu,Jian Sun,Zhifeng Ying,Jiada Wu
DOI: https://doi.org/10.1016/j.sse.2008.09.005
IF: 1.916
2008-01-01
Solid-State Electronics
Abstract:The preparation of bismuth doped ZnSe films on silicon (100) by pulsed laser deposition (PLD) is reported. Bismuth was used as a p-type dopant source material for ZnSe. The stable p-type films with hole carrier concentration of about 1016–1018cm−3 were obtained. By scanning electron microscopy (SEM) and X-ray diffraction (XRD), it was found that the ambient pressure during film deposition has much to do with the morphology and crystallinity of the as-deposited products. The presence of Bi in the Bi-doped ZnSe films was confirmed by the X-ray photoelectron spectroscopy (XPS) and the possibility of a BiZn–2VZn complex forming a shallow acceptor level was discussed.
What problem does this paper attempt to address?