Abstract:The invention relates to a testing method for a field programmable gate array (FPGA). The method comprises the following steps: obtaining an initial design netlist and an initial design configuration of the FPGA; replacing a look-up table function of the initial design netlist and the initial design configuration with an exclusive or function of a logic function to obtain an initial testing netlist and an initial testing configuration; selecting an observation node of the initial testing netlist based on a preset rule of a testability analysis method, and obtaining a testing netlist and a corresponding testing vector; configuring an output terminal of an output and input unit from the observation node to the initial testing configuration to obtain a testing configuration; connecting the testing configuration to an configuration device according to an excitation signal of the configuration device to obtain an output logic value of the testing vector; and analyzing the output logic value and a response value of the testing vector to obtain the testing result. The method can effectively detect permanent faults of interconnection lines used in the application design of FPGA chips.

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

A New Automatic Method for Testing Interconnect Resources in Fpgas Based on General Routing Matrix

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

Testing FPGA Local Interconnects Based on Repeatable Configuration Modules (abstract Only)

A Novel Scheme for Application-Dependent Testing of FPGAs

A novel FPGA manufacture-oriented interconnect fault test

A Novel Automated FPGA Interconnect Test Algorithm

Fault Detection for FPGA's Logic Resources on Test System

Method and system for testing on site programmable gate array

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

A design-for-test for SRAM-based FPGA interconnect testing

A Novel FPGA Local Interconnect Test Scheme and Automatic TC Derivation/generation

FPGA Interconnect Test Algorithm Based on Routing Resource Graph

BIST-based test and diagnosis of FPGA logic blocks

Application-Dependent Interconnect Testing Of Xilinx Fpgas Based On Line Branches Partitioning

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

Research on Fault Mask in the Test of FPGA

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Application Dependent FPGA Interconnect Test Method with Small Test Configuration Number Using SMT Net-Grouping Constraints

Real-time Diagnosis of Multiple Transistor Open-Circuit Faults in a T-type Inverter Based on Finite-State Machine Model