Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

Shuo Wang,Zhiping Wen,Lei Chen,Lei Wang,Zengrong Liu
2009-01-01
Abstract:A novel methodology for the derivation of test configurations (TCs) automatically for application-independent manufacturing testing of the interconnect resources of SRAM-based FPGAs is presented. First, we model the local/global interconnect resources of SRAM-based FPGAs using adjacency graph and bipartite graph respectively Then, we use a modified simulated annealing algorithm to solve the graph coloring problem, in order to obtain the minimal TCs for the interconnect resources testing. To validate the proposed methods, the interconnect resources model and TC derivation method is applied to our BMTI BQV50 FPGA(1), which is fabricated using 0.25um CMOS technology and is compatible to Xilinx XCV50 FPGA. A minimal number of TCs is obtained automatically.
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