Abstract:Block RAMs (BRAMs) play an important role in modern heterogenous FPGAs, hence how to test them comprehensively and effectively becomes a major concern. On-chip Partial Bitstream Relocation (PBR) technique based on FPGA Dynamic Partial Reconfiguration (DPR) can decrease the time spent on configuring modules in FPGA while reducing the memory resources overhead for storing partial bitstreams of the reconfigurable modules. The previous PBR technique is difficult to be combined with BRAM test directly, because they are somehow tedious, unsuitable for large-scale design or limited to specific devices. Besides, the problem exists for BRAM testing is that fault model is still incomplete and testing algorithms need to be improved to achieve higher fault coverage. An Effective BRAM test method based on a novel PBR technique is proposed in this paper. Our test method establishes a complete fault model for BRAM and improves the testing algorithms for faults in BRAM ECC circuits and intra-word coupling faults in SRAM cells. On-board experiments are carried out with Xilinx xc7vx690t device, and 14 BRAM configurations are used to fully test BRAMs. In conjunction with the proposed PBR technique, the number of configurations can be reduced to 10, which leads to a 35.7% time saving.

BIST Approach for Testing Configurable Logic and Memory Resources in FPGAs.

A Novel BIST Approach for Testing Logic Resources Using Hard Macro

A novel BIST approach for testing input/output buffers in FPGAs.

Bist Approach for Testing Embedded Memory Blocks in System-On-Chips

A Novel BIST Approach for Testing Input/Output Buffers in SOCs

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

BIST-based test and diagnosis of FPGA logic blocks

A novel FPGA manufacture-oriented interconnect fault test

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

A Novel Full Coverage Test Method for CLBs in FPGA (abstract Only).

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

An Effective Test Method for Block RAMs in Heterogeneous FPGAs Based on a Novel Partial Bitstream Relocation Technique

Hybrid BIST for system-on-a-chip using an embedded FPGA core

Fault Detection for FPGA's Logic Resources on Test System

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

A Cost-Efficient Self-Configurable BIST Technique for Testing Multiplexer-Based FPGA Interconnect

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Testing FPGA Local Interconnects Based on Repeatable Configuration Modules (abstract Only)

BIST Methodology, Architecture and Circuits for Pre-Bond TSV Testing in 3D Stacking IC Systems

A New Automatic Method for Testing Interconnect Resources in Fpgas Based on General Routing Matrix

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays