Abstract:SRAM-Filed Programmable Gate Arrays (FPGA) have become one of the most important carriers of digital electronic system because of its many inborn advantages.However, as manufacture of Integrated Circuit evolves towards Very Deep Sub-Micron technology, FPGA designers must be careful of circuit's Single Event Upset (SEU) susceptibility when used in hostile environment, such as avionics and space applications where reliability is vital.We proposed a SEU-fault emulation platform to evaluate circuit's SEU mitigation performance.The platform does not need any external circuit or micro controller to manage fault emulation process compared with existing approach.Source codes of Circuit Under Test (CUT) do not need to be modified or intruded with any component.It is a non-intrusive testing.Communication between host-computer and emulation board is minimized to accelerate fault injection speed.Experimental result shows that a single fault injecting (including Multi-Bits-Upset) only costs 29us.A circuit state reloading technology is exploited to increase emulation efficiency.Moreover, in the field of evolvable hardware, genetic operations can be reconfigured and its fitness can be evaluated on-line using the proposed fast dynamic reconfiguration method, which is useful for implementing self-repair and self-evolutionary hardware.

A novel FPGA manufacture-oriented interconnect fault test

Built-In Self-Test Design For Fault Detection Of Muxfxs In Sram-Based Fpgas

Study of Test Method Based on BIST for FPGA

A design-for-test for SRAM-based FPGA interconnect testing

A novel BIST approach for testing input/output buffers in FPGAs.

BIST Approach for Testing Configurable Logic and Memory Resources in FPGAs.

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

A Novel Automated FPGA Interconnect Test Algorithm

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

A Novel BIST Approach for Testing Input/Output Buffers in SOCs

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

A Cost-Efficient Self-Configurable BIST Technique for Testing Multiplexer-Based FPGA Interconnect

A Novel BIST Approach for Testing Logic Resources Using Hard Macro

Hybrid BIST for system-on-a-chip using an embedded FPGA core

A Novel Scheme for Application-Dependent Testing of FPGAs

Research on an Intelligent Test Method for Interconnect Resources in an FPGA

Application-Dependent Interconnect Testing Of Xilinx Fpgas Based On Line Branches Partitioning

FPGA Interconnect Test Algorithm Based on Routing Resource Graph

A Kind of Low-cost Non-intrusive Autonomous Fault Emulation System